CART Highlights
New Auger and XPS Instruments Installed
Two new instruments were recently installed in the Center for Advanced Research and Technology (CART) at the University of North Texas. A Scanning Auger Nanoprobe and a VersaProbe™ Scanning XPS Microprobe, both from Physical Electronics Inc., were installed at the Discovery Park facility in March 2008 and are now in operation.
The Scanning Auger Nanoprobe has full analytical capability including secondary electron imaging, multiple Auger point, line and area analyses, Auger imaging, depth-compositional analysis, backscattered electron imaging, and automated multi-location analysis.
The VersaProbe™ Scanning XPS Microprobe can be used to analyze the chemical bond states as well as the quantitative composition of a variety of materials including metals, ceramics, and polymers.
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