CART Highlights
New Instruments Installed in the Center for Advanced Research and Technology at UNT
Two new instruments were recently installed in the Center for Advanced Research and Technology (CART) at the University of North Texas. A Scanning Auger Nanoprobe and a VersaProbe™ Scanning XPS Microprobe, both from Physical Electronics Inc., were installed at the Discovery Park facility in March 2008 and are now in operation.
The Scanning Auger Nanoprobe has full analytical capability including secondary electron imaging, multiple Auger point, line and area analyses, Auger imaging, depth-compositional analysis, backscattered electron imaging, and automated multi-location analysis.
The VersaProbe™ Scanning XPS Microprobe can be used to analyze the chemical bond states as well as the quantitative composition of a variety of materials including metals, ceramics, and polymers. This highly automated XPS instrument uses a high-flux X-ray source providing a highly focused monochromatic X-ray beam, (10µm to 100µm) that can be scanned upon the sample surface. The high-resolution 180-degree spherical capacitor energy analyzer provides full-featured XPS analysis capability including XPS spectral, map, depth profile, line scan, and angle-resolve analyses.
Detailed information about the instruments is available by following the links in the text above or by navigating to the “Facilities” pages of the CART web site. Information about scheduling, training, or testing is available online, or by contacting facility manager David Diercks at drd0036@unt.edu or 940-369-8106.
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Click here for information about how to request training on CART instruments.
Customers outside UNT can find more information about testing or scheduling at cart.unt.edu/users.html
