CART Facilities
Dual Beam FIB/SEM
The FEI Nova 200 NanoLab (a dual column ultra-high resolution field emission scanning electron microscope (SEM) and focused ion beam (FIB)) was installed in January 2005.
Etching with an accelerated Ga ion beam and deposition using Pt are available for nanoscale prototyping, machining, 2-D and 3-D characterization, and analysis.
The system is expandable making additional gas injection systems available for deposition and etching in the future. Nanoscale chemical analysis may be performed with an EDAX energy dispersive X-ray spectroscopy (EDS) system with spectrum imaging control. The secondary electron image resolution at the dual beam coincidence point is 1.5 nm at 15 kV. The FIB optics have better than 7 nm resolution at 30 kV.
A high resolution digital patterning system controlled from the User Interface is also available. Predefined device structures in Bitmap format can be directly imported to the patterning system for nanoscale fabrication. The FEI Nova 200 is also equipped with an Omniprobe Autoprobe nano-manipulator, with 10 nm positioning resolution.
The manipulator can be fit with either sharp whisker probes for electrically probing samples or standard probes for mechanical testing. Additionally, the manipulator allows for extraction of a milled, site-specific region for transmission electron microscopy examination.
The instrument is also outfitted with an electron backscattered diffraction (EBSD) system, which allows for crystallographic determination on the nanoscale, and, along with imaging capabilities, 3-D reconstructions of the material and crystallography.
Instrument Specifications
Electron Optics
- High-resolution Field Emission-SEM column, with monopole magnetic immersion final lens, Schottky thermal field emitter, 60 degree objective lens geometry and heated objective apertures.
- Resolution @ optimum WD – 1.1 nm @ 15 kV (TLD-SE)
- Resolution @ beam coincidence point:
– 1.5 nm @ 15 kV (TLD-SE)
– 2.0 nm @ 5 kV (TLD-SE)
- Accelerating voltage: 2 kV – 30 kV
- Probe current: 2.5 pA – 37 nA
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Detectors
- In-lens SE detector (TLD-SE)
- In-lens BSE detector (TLD-BSE)
- Everhardt Thornley SED
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Fabrication and Machining
- Minimum deposited line width (Ion beam, Pt): 50 nm
- Minimum deposited line width (Electron beam, Pt): 20 nm
- Typical TEM sample prep membrane thickness: 50 - 100 nm
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Ion Optics
- Magnum™ ion column with Ga liquid metal ion source
- Resolution: 7 nm
- Accelerating voltage: 5 kV – 30 kV
- Probe current: 0.15 pA – 20 nA
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Equipped with:
- EDAX Sapphire Si(Li) Detecting Unit, 30 mm2 detector crystal, Genesis software
- TSL Digiview III Electron Backscatter Diffraction (EBSD) detector, OIM™ software
- Omniprobe Autoprobe™ 200 Nano-manipulator
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Gas Chemistry
- Platinum metal deposition
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Click here for information about Equipment Use and/or Training.
Click here for information about Equipment Rates.
Click here to go to the Online Schedule.
For more information about CART equipment, contact David Diercks at 940-369-8106 or drd0036@unt.edu
