Center for Advanced Research and Technology :: University of North Texas

CART Facilities

$High-Resolution X-Ray Diffraction$ High Resolution X-ray Diffraction

A new high resolution XRD was acquired by CART in 2006. The Rigaku Ultima III enables a variety of applications including in-plane and normal geometry phase identification, quantitative analysis, lattice parameter refinement, crystallite size, structure refinement, residual stress, density, roughness and multilayer thicknesses (from reflectivity geometries), and depth-controlled phase identification.

Detection consists of a computer-controlled scintillation counter or a fast semiconductor-based position sensitive detector.

In addition to Bragg geometries, the system is also capable of thin film analysis, grazing incidence diffraction, pole figure analyses, 1500°C hot stage, transmission and reflective small-angle x-ray scattering, and reciprocal space mapping.

Instrument Specifications

X-Ray Generator

Maximum rated output 3 kW
Rated tube voltage 20 - 60 kV
Rated tube current 2 - 60 mA
Target: Cu
Focus size 0.4 x 12 mm

Monochromators

Dual position graphite diffracted beam monochromator
Ge (220) 2-bounce high-resolution incident beam monochromator

Detectors

Scintillation counter
D/tex-25 fast position sensitive detector (up to 160° 2θ / minute)

Goniometer

Scanning mode - θs/θd coupled or θs, θd independent
Goniometer radius 285 mm
2θ measuring range -3 to 162° (maximum)
Minimum step size 0.0001°
In-plane arm

Attachments

Thin film attachment
Transmission small angle x-ray scattering
HT 1500 high temperature attachment (up to 1500°C), may be operated in air, gas, vacuum, or under liquid nitrogen cooling conditions

Optics