| Equipment Name |
External Commercial Hourly Rate
--INSTRUMENT ONLY |
External Commercial Hourly Rate
--WITH TECHNICIAN |
|
| Veeco Multimode Atomic Force Microscope (AFM) |
150 |
rate + 50 |
|
| FEI Quanta 200 Environmental Scanning Electron Microscope (ESEM) |
150 |
rate + 50 |
|
| FEI Tecnai F20 Transmission Electron Microscope (TEM) |
230 |
rate + 50 |
|
| JEOL 5800 Scanning Electron Microscope (SEM) |
120 |
rate + 50 |
|
| Woollam VASE Variable-Angle Spectroscopic Ellipsometer |
150 |
rate + 50 |
|
| Imago LEAP -- 3D Atom Probe |
350 |
rate + 100 |
|
| Philips E420 Transmission Electron Microscope (TEM) |
150 |
rate + 50 |
|
| FEI Nova 200 Scanning Electron Microscope / Focused Ion Beam (SEM/FIB-Dual Beam) |
200 |
rate + 50 |
|
| Physical Electronics VersaProbe V-1000 XPS / ESCA |
150 |
rate + 50 |
|
| Physical Electronics 670xi Auger Nanoprobe |
120 |
rate + 50 |
|
| Rigaku Ultima III -- x-ray diffractometer XRD |
150 |
rate + 50 |
|
| Micro Photonics TRBH-MT tribometer |
120 |
rate + 50 |
|
| Thermo Electron Almega XR raman spectrometer |
120 |
rate + 50 |
|
| Thermo Electron Nicolet 6700 fourier transform infrared spectrometer (FTIR) |
120 |
rate + 50 |
|
| Scintag Pad V x-ray diffractometer XRD |
80 |
rate + 50 |
|
| TA Instruments ARES-LS2 Rheometer |
100 |
rate + 50 |
|
| Veeco Dektak150 Profilometer |
100 |
rate + 50 |
|
| Solartron Analytical 1260A Impedance Analyzer |
80 |
rate + 50 |
|
| Rutherford Backscattering (RBS) |
150* |
rate + 50 |
|
| Instron Dynatup Impact Tester |
120* |
rate + 50 |
|
| American Leistritz Extruder Corp Biopolymer Extruder |
120* |
rate + 50 |
|
| Optomec LENS Laser-Engineered Net Shaping |
150* |
rate + 50 |
|
| Optomec M3D Maskless Mesoscale-Materials Deposition |
120* |
rate + 50 |
|
| Custom Organic Light-Emitting Diode (OLED) Evaporator |
120* |
rate + 50 |
|
| Kurt J. Lesker PVD-75 Physical Vapor Deposition System |
80* |
rate + 50 |
|
| Imago Electropointer Electropolisher |
10 |
10 |
|
| Sonic Corp Rotomill Colloid Grinding Mill |
10 |
10 |
|
| Sputter coater for SEM |
10 |
10 |
|
| Precision Ion Polisher (PIPS) |
10 |
10 |
|
Nikon Eclipse ME600 optical microscope
(only if doing topographic series) |
0 |
0 |
|
| * Also availalble on per sample pricing |
