CART Facilities
Raman Spectrometer
An Almega XR Raman spectrometer was purchased by CART from Thermo Electron in 2007. This high performance dispersive Raman spectrometer can be used for identification and quantification of both organic and inorganic materials. The system is equipped with an Olympus BX51 microscope with motorized stage, mapping capabilities, and spatial resolution down to 1 um.
The "Omnic™ for Almega 7" analytical-software package includes fluorescence correction with all excitation frequencies as well as search and example libraries, spectral interpretation guide, data collection, and manipulation functionality.
Instrument Specifications
Performance Features
- Almega XR 780nm (NIR) laser (100-3100cm-1 Raman shift)
- Almega XR 532nm (green) laser (100-4000 cm-1 Raman shift)
- High and low resolution grating for each wavelength
- Spectral resolution 2cm-1 FWHM (1cm-1per CCD pixel element)
- Spatial resolution (diffraction limited) down to 1um
- Confocal depth profiling resolution down to 2um
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Microscope
- Olympus BX51 microscope, reflection illuminator
- Confocal optics with confocal aperture
- Automated system calibration
- Fully automated optical alignment
- 2" x 3" travel stage
- Working distance objectives 10x, 20x, 50x, 100x
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Software
- OMNIC™ for Almega 7 including:
- Search libraries, spectral interpretation guide
- TQ Analyst Professional Addition
- Atlus™ Microscopy software 7 for Almega
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Detectors
- High sensitivity, TE-cooled silicon CCD array detector
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Click here for information about Equipment Use and/or Training.
Click here for information about Equipment Rates.
Click here to go to the Online Schedule.
For more information about CART equipment, contact David Diercks at 940-369-8106 or drd0036@unt.edu
