CART Facilities

Scanning Electron Microscope

A JEOL JSM 5800 Scanning Electron Microscope is available for general microscopic analyses.

It has an EDAX energy dispersive spectrometry system for chemical analysis.

 

 

Instrument Specifications

Electron Source Up to 30kV operating voltage W filament source Microanalysis EDS - EDAX Sapphire Si(Li) Detecting Unit, 30 mm2 detector crystal, Genesis software Specimen holder Six stub specimen holder

 

Click here for information about Equipment Use and/or Training.

Click here for information about Equipment Rates.

Click here to go to the Online Schedule.

For more information about CART equipment, contact David Diercks at 940-369-8106 or drd0036@unt.edu

CART
Center for Advanced Research & Technology
3940 North Elm Street, Suite A-160
Denton, Tx 76207

Phone 940-369-8139
Fax 940-565-2944

 

This page maintained by
Leta Krumrine, Leta.Krumrine@unt.edu,
Phone 940-369-8293