Center for Advanced Research and Technology

CART Facilities

The Center for Advanced Research and Technology
(CART) currently maintains and operates more than two dozen instruments for advanced characterization and processing, including:

High-Resolution Analytical TEM FEI Tecnai G2 F20 S-Twin 200keV field emission scanning transmission electron microscope (S/TEM)		Dual Beam SEM/FIB FEI Nova 200 NanoLab— a dual column ultra-high resolution field emission scanning electron microscope (SEM) and focused ion beam (FIB)
Local Electrode Atom Probe (LEAP) Imago Scientific local electrode atom probe (LEAP) instrument with added laser-pulsed evaporation technique	$Hi-resolution X-ray Diffraction$	High Resolution X-ray Diffraction Rigaku Ultima III high-resolution XRD
Environmental SEM FEI Quanta environmental scanning electron microscope (ESEM)		Raman Spectrometer Thermo Electron Almega XR
Atomic Force Microscope Veeco (Digital Instruments) Multimode Nanoscope III		Variable Angle Spectroscopic Ellipsometer J.A. Woollam variableangle spectroscopic ellipsometer (VASE)
Tribometer Microphotonics pin-on-disk tribometer		Fourier Transform Infrared Spectrometer Thermo Electron Nicolet 6700 FTIR
Profilometer Veeco Dektak 150		Rheometer TA Instruments ARES-LS2 rheometer
OLED Evaporator Custom built deposition system for organic thin film applications		Biopolymer Extruder American Leistritz Extruder Corp extruder for film, sheet, and ribbon extrusion
Laser Engineered Net Shaping Optomec LENS 750		Maskless Mesoscale Materials Deposition Optomec M³D
Physical Vapor Deposition Kurt J. Lesker PVD-75		Instrumented Impact Tester Instron Dynatup® 9250HV impact tester
Rutherford Backscattering Spectrometry		X-ray Photoelectron Spectrometer PHI 5000 Versaprobe
Scanning Auger Nanoprobe PHI 670xi