CART Facilities
Atomic Force Microscope
A Veeco (formerly Digital Instruments) Nanoscope III was installed in the CART facilities in September 2005.
This instrument is capable of tapping and contact-mode atomic force microscopy (AFM), scanning tunneling microscopy (STM), magnetic force microscopy, and force-modulation microscopy.
In addition, it has a multimode heater and cooler for in-situ studies.
Instrument Specifications
Scanner Range (XxYxZ)
- E - 10μm x 10μm x 2.5μm
- J - 125μm x 125μm x 5.0μm
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Modes
- Contact atomic force microscopy
- Tapping mode atomic force microscopy
- Mapping tapping mode (phase imaging)
- Magnetic force microscopy
- Force modulation
- Lateral force microscopy
- Scanning tunneling microscopy
- Lithography (nanoindentation and nanoscratching)
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Noise
- <0.3Å RMS in vertical (Z) dimension w/ vibration isolation
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Sample Size
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Accessories
- Multimode heater/cooler
(-35°C to 250°C)
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Vibrational and Acoustic Isolation
- Vibration isolation platform
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Click here for information about Equipment Use and/or Training.
Click here for information about Equipment Rates.
Click here to go to the Online Schedule.
For more information about CART equipment, contact David Diercks at 940-369-8106 or drd0036@unt.edu
